Enhancing Testing Efficiency and Reducing Time-to-Market
At SiSoC, we integrate Design for Testability (DFT) techniques to streamline testing and validation, improving yield and reducing overall costs. Our DFT solutions include scan insertion, boundary scan, built-in self-test (BIST), and other methodologies that enable effective testing at all stages of the production process. By embedding DFT features, we enhance our clients' ability to diagnose and troubleshoot designs, ensuring high reliability and faster time-to-market. Our DFT services align with industry best practices, making it easier to detect and resolve potential issues efficiently.
Why Choose SiSoC for
Design for Testability DFT?
Our comprehensive service offerings span the full ASIC
development cycle, from early-stage design to advanced
verification and system integration.
Advanced DFT Expertise
SiSoC's DFT services leverage techniques like scan insertion, boundary scan, and built-in self-test (BIST), ensuring your design is thoroughly testable and robust.
Improved Testing Efficiency
Our DFT methodologies reduce testing times and improve fault coverage, helping you achieve faster time-to-market while minimizing the risk of design errors.
Reliability and Diagnostics
By embedding DFT features into your design, we enable accurate diagnostics and effective troubleshooting, increasing overall product quality and yield.
Services We Offer
DFT Planning and Architecture
Comprehensive testability planning and strategy development tailored to each project’s specific requirements.
Implementation
Integration of scan insertion, BIST, boundary scan, and other DFT techniques, ensuring optimal testability throughout the design.
Validation and Diagnostics
Testing and verification of DFT features to confirm functionality, with advanced diagnostics for efficient debugging and high product reliability.
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With SiSoC Semiconductor, achieve reliable and high-performance verification for your ASIC/SoC designs, supported by our in-depth experience and commitment to quality and innovation.
